Micro X-ray Fluorescence Map of Garnet Schist From the Black Hills, South Dakota, Via Scanning Electron Microscope Controlled Stage Mapping Reveals The Distribution
of Trace Elements at Concentrations Below Detection of Other Microanalysis Methods
Craig Schwandt, Ph.D., McCrone Associates, Inc. Westmont, IL
Ken Witherspoon, IXRF Systems, Houston, TX
Figure 1: Element maps of mica schist with garnet using IXRF X-beam mounted on a JEOL JSM-6460LV. Dwell time was 5 s per pixel. Maps cover 2 by 2mm with 100 by 100 pixels.